Use este identificador para citar ou linkar para este item: https://locus.ufv.br//handle/123456789/24496
Tipo: Artigo
Título: Local roughness exponent in the nonlinear molecular-beam-epitaxy universality class in one dimension
Autor(es): Ferreira, Silvio C.
Luis, Edwin E. Mozo
Assis, Thiago A. de
Andrade, Roberto F. S.
Abstract: We report local roughness exponents, αloc, for three interface growth models in one dimension which are believed to belong to the nonlinear molecular-beam-epitaxy (nMBE) universality class represented by the Villain-Lais-Das Sarma (VLDS) stochastic equation. We applied an optimum detrended fluctuation analysis (ODFA) [Luis et al., Phys. Rev. E 95, 042801 (2017)] and compared the outcomes with standard detrending methods. We observe in all investigated models that ODFA outperforms the standard methods providing exponents in the narrow interval αloc∈[0.96,0.98] quantitatively consistent with two-loop renormalization group predictions for the VLDS equation. In particular, these exponent values are calculated for the Clarke-Vvdensky and Das Sarma-Tamborenea models characterized by very strong corrections to the scaling, for which large deviations of these values had been reported. Our results strongly support the absence of anomalous scaling in the nMBE universality class and the existence of corrections in the form αloc=1−ε of the one-loop renormalization group analysis of the VLDS equation.
Palavras-chave: Roughness exponent
Epitaxy
Editor: Physical Review
Tipo de Acesso: Open Acess
URI: https://doi.org/10.1103/PhysRevE.99.022801
http://www.locus.ufv.br/handle/123456789/24496
Data do documento: Fev-2019
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