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Campo DC | Valor | Idioma |
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dc.contributor.author | Almeida, Renan A. L. | |
dc.contributor.author | Ferreira, Sukarno O. | |
dc.contributor.author | Ferraz, Isnard | |
dc.contributor.author | Oliveira, Tiago J. | |
dc.date.accessioned | 2017-10-20T10:48:05Z | |
dc.date.available | 2017-10-20T10:48:05Z | |
dc.date.issued | 2017-06-19 | |
dc.identifier.issn | 20452322 | |
dc.identifier.uri | https://doi.org/10.1038/s41598-017-03843-1 | |
dc.identifier.uri | http://www.locus.ufv.br/handle/123456789/12231 | |
dc.description.abstract | The Kardar-Parisi-Zhang (KPZ) class is a paradigmatic example of universality in nonequilibrium phenomena, but clear experimental evidences of asymptotic 2D-KPZ statistics are still very rare, and far less understanding stems from its short-time behavior. We tackle such issues by analyzing surface fluctuations of CdTe films deposited on polymeric substrates, based on a huge spatio-temporal surface sampling acquired through atomic force microscopy. A pseudo-steady state (where average surface roughness and spatial correlations stay constant in time) is observed at initial times, persisting up to deposition of ~104 monolayers. This state results from a fine balance between roughening and smoothening, as supported by a phenomenological growth model. KPZ statistics arises at long times, thoroughly verified by universal exponents, spatial covariance and several distributions. Recent theoretical generalizations of the Family-Vicsek scaling and the emergence of log-normal distributions during interface growth are experimentally confirmed. These results confirm that high vacuum vapor deposition of CdTe constitutes a genuine 2D-KPZ system, and expand our knowledge about possible substrate-induced short-time behaviors. | en |
dc.format | pt-BR | |
dc.language.iso | eng | pt-BR |
dc.publisher | Scientific Reports | pt-BR |
dc.relation.ispartofseries | 7: 3773, June 2017 | pt-BR |
dc.rights | Open Access | pt-BR |
dc.subject | Semiconductor | pt-BR |
dc.subject | Polymer deposition | pt-BR |
dc.title | Initial pseudo-steady state & asymptotic KPZ universality in semiconductor on polymer deposition | en |
dc.type | Artigo | pt-BR |
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s41598-017-03843-1.pdf | Texto completo | 2,12 MB | Adobe PDF | Visualizar/Abrir |
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