Use este identificador para citar ou linkar para este item: https://locus.ufv.br//handle/123456789/21967
Tipo: Artigo
Título: Quantification of yield loss due to coffee leaf scorch
Autor(es): Rocha, Janilson G.
Zambolim, Laércio
Zambolim, Eunize M.
Vale, Francisco X. Ribeiro do
J. Junior, Waldir C.
Bergamin Filho, Armando
Abstract: Coffee leaf scorch caused by Xylella fastidiosa is widespread in major coffee-growing regions of Brazil. This study was done to quantify the yield loss caused by this disease. The severity data of the disease were collected during the 2006, 2007 and 2008 seasons at commercial plantations growing Coffea arabica ‘Catuaí’ in São Gotardo-MG in 250 plants of three blocks of 7000 coffee plants each. Fifty selected plants per block with different disease severities were determined. The linear regression showed a significant relationship (P < 0.01) between disease severity and bean yield and between disease severity and grain size in all years. The relationship between yield and the disease severity was significant (P < 0.01). For each 1% increase in the disease severity, there was a decrease of 1.22, 1.34 and 2.02 bags of bean yield/ha in 2006, 2007 and 2008, respectively, thus showing the importance of the disease in reducing coffee bean yields.
Palavras-chave: Xylella fastidiosa
Coffea arabica
Damage
Editor: Crop Protection
Tipo de Acesso: Elsevier Ltd.
URI: https://doi.org/10.1016/j.cropro.2010.04.011
http://www.locus.ufv.br/handle/123456789/21967
Data do documento: Out-2010
Aparece nas coleções:Fitopatologia - Artigos

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