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https://locus.ufv.br//handle/123456789/12231
Tipo: | Artigo |
Título: | Initial pseudo-steady state & asymptotic KPZ universality in semiconductor on polymer deposition |
Autor(es): | Almeida, Renan A. L. Ferreira, Sukarno O. Ferraz, Isnard Oliveira, Tiago J. |
Abstract: | The Kardar-Parisi-Zhang (KPZ) class is a paradigmatic example of universality in nonequilibrium phenomena, but clear experimental evidences of asymptotic 2D-KPZ statistics are still very rare, and far less understanding stems from its short-time behavior. We tackle such issues by analyzing surface fluctuations of CdTe films deposited on polymeric substrates, based on a huge spatio-temporal surface sampling acquired through atomic force microscopy. A pseudo-steady state (where average surface roughness and spatial correlations stay constant in time) is observed at initial times, persisting up to deposition of ~104 monolayers. This state results from a fine balance between roughening and smoothening, as supported by a phenomenological growth model. KPZ statistics arises at long times, thoroughly verified by universal exponents, spatial covariance and several distributions. Recent theoretical generalizations of the Family-Vicsek scaling and the emergence of log-normal distributions during interface growth are experimentally confirmed. These results confirm that high vacuum vapor deposition of CdTe constitutes a genuine 2D-KPZ system, and expand our knowledge about possible substrate-induced short-time behaviors. |
Palavras-chave: | Semiconductor Polymer deposition |
Editor: | Scientific Reports |
Tipo de Acesso: | Open Access |
URI: | https://doi.org/10.1038/s41598-017-03843-1 http://www.locus.ufv.br/handle/123456789/12231 |
Data do documento: | 19-Jun-2017 |
Aparece nas coleções: | Artigos |
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s41598-017-03843-1.pdf | Texto completo | 2,12 MB | Adobe PDF | Visualizar/Abrir |
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